Atomic-resolution studies of materials by aberration-corrected scanning transmission electron microscopy

Ondrej L. Krivanek, Arizona State University
Event Date and Time: 
Thu, 2016-03-03 14:00 - 15:00
Hennings 318
Local Contact: 
George Sawatzky
Intended Audience: 

Aberration-corrected scanning transmission electron microscopes (STEMs) are now able to form electron probes as small as 0.5 Å in diameter, and they can image and spectroscopically analyze single atoms in-situ.  Nion Co., has pioneered these advances, by developing the first aberration corrector that improved spatial resolution of an electron microscope to better than 1 Å, and later on by developing a new STEM that can acquire images and high quality spectra from single atoms in many different types of materials.  More recently, we have introduced a monochromated STEM system for electron energy loss spectroscopy (EELS), which has made vibrational spectroscopy possible at an energy resolution better than 10 meV, and a spatial resolution of a few nm.

This seminar will review the basic principles behind the new developments, illustrate them with experimental results from a variety of materials, and discuss and illustrate especially inviting future directions.

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